Sortiment Taylor & Francis Inc: Technické vědy
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Totten, Christopher W. (American University, Washington, DC, USA)
Skladem
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Elbert, Mike (Elbert Lean Business Systems)
Skladem
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Vila, Sam (VP of Content & Production, Macroh USA)
Dostupné
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Swink, Steve (Flashbang Studios, Tempe, Arizona, USA)
Dostupné
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Polyanin, Andrei D. (Russian Academy of Sciences, Moscow); Chernoutsan, Alexei I. (Gubkin Russian State University of O
Dostupné
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Capolino, Filippo (University of California, Irvine)
Dostupné
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De Silva, Clarence W. (University of British Columbia, Vancouver, Canada)
Dostupné
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Revankar, Shripad T.; Majumdar, Pradip
Dostupné
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TED ANDERSON
Dostupné
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Blackburn, J. Lewis (Consultant, Bothell, Washington, USA); Domin, Thomas J. (PPL, Inc., Allentown, Pennsylvania, USA)
Dostupné
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Autor neuveden
Dostupné
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Boothroyd, Geoffrey (Boothroyd Dewhurst Inc., Wakefield, Rhode Island, USA); Dewhurst, Peter (University of Rhode Island
Dostupné
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Bridger, Robert
Dostupné
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Scheele, Carsten
Dostupné
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Richerson, David W. (Retired, University of Utah.); Lee, William E. (Imperial College, London)
Dostupné
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Autor neuveden
Dostupné
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Nayak, Ajit Kumar (Siksha `O' Anusandhan University, Bhubaneswar, India); Rai, Satyananda Champati (Silicon Institute of
Dostupné
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Rierson, Leanna (Digital Safety Consulting, Wichita, Kansas, USA)
Dostupné
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Sierksma, Gerard (University of Groningen, The Netherlands); Sierksma, Gerard (University of Groningen, The Netherlands)
Dostupné
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Hamming, Richard W.
Dostupné