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MEGA VÝHODNÉ
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
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An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
schovat popis
- Nakladatel: Springer-Verlag New York Inc.
- Kód:
- Rok vydání: 2013
- Jazyk: Angličtina
- Vazba: Taschenbuch
- Počet stran: 689
- Šířka balení: 25.5 cm
- Výška balení: 18.2 cm
- Hloubka balení: 4.3 cm
- Váha balení: 1.4 kg
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