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MEGA VÝHODNÉ
... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques. Jian-Min Zuo,...
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... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques. Jian-Min Zuo, Microscopy & Microanalysis
schovat popis
- Nakladatel: Oxford University Press
- Kód:
- Rok vydání: 2017
- Jazyk: Angličtina
- Vazba: Brožovaná
- Počet stran: 432
- Šířka balení: 18.2 cm
- Výška balení: 24.6 cm
- Hloubka balení: 1.9 cm
- Váha balení: 810 g
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