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MEGA VÝHODNÉ
Chapter 1 Predictive Reliability of Embedded Electronic Systems§Chapter2 Measuring Method of the Internal Temperature of Electronic Components§Chapter 3 Dynamic Analysis of Mechatronic Components by Laser Vibrometry§Chapter 4 Measurement of Static and Vibratory Deformations and Displacements by...
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Chapter 1 Predictive Reliability of Embedded Electronic Systems§Chapter2 Measuring Method of the Internal Temperature of Electronic Components§Chapter 3 Dynamic Analysis of Mechatronic Components by Laser Vibrometry§Chapter 4 Measurement of Static and Vibratory Deformations and Displacements by Full Field Methods§Chapter 5 Characterization of the Electromagnetic Environment of Microwave Frequency Circuits§Chapter 6 Characterization of the Behavior of Radiofrequency Power Transistors under Thermal and Electromagnetic Stresses§Chapter7 Characterization of the Ability of Switching Transistors to Resist to Electrical Overstress§Chapter8 Spectroscopy of Non-destructive Characterizations of the Interface Physics of Mechatronics Devices§Chapter 9 Study of the Dynamic Contact between Deformable Solids
schovat popis
- Nakladatel: Elsevier Books
- Kód:
- Rok vydání: 2015
- Jazyk: Angličtina
- Vazba: Gebunden
- Počet stran: 262
- Šířka balení: 15.9 cm
- Výška balení: 23.6 cm
- Hloubka balení: 2 cm
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