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MEGA VÝHODNÉ
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below. It sets out state-of-the-art variation-aware design tools that will help them fix their problems efficiently.
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This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below. It sets out state-of-the-art variation-aware design tools that will help them fix their problems efficiently.
schovat popis
- Nakladatel: Springer-Verlag New York Inc.
- Kód:
- Rok vydání: 2012
- Jazyk: Angličtina
- Vazba: Gebunden
- Počet stran: 188
- Šířka balení: 24.2 cm
- Výška balení: 16.7 cm
- Hloubka balení: 1.3 cm
- Váha balení: 468 g
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